PIXE and SPM
Proton-induced X-ray emission can be used to analyze a wide
range of trace elements (including transition, large-ion-lithophile
and high-field-strength elements, and, infavourable
circumstances, rare earth elements) in a variety of minerals down to levels of
a few parts per million. The analyses are simultaneous, multi-element, and
non-destructive. A focused proton beam (spot sizes typically 5 x 5 µm) can be
used for point analyses or the beam may be scanned over an area as large as 2mm
x 2mm to provide a 2-dimensional X-ray map of element distribution. The proton
beam may also be used for nuclear reaction analysis and proton-induced
gamma-ray emission. These techniques may be run concurrently with PIXE and are
useful for analyzing light elements such as Li, B and F, providing detection
limits in the region of 100 ppm. To learn more about PIXE contact www.physics.uoguelph.ca/PIXE
This scanning proton microprobe view is of fractures an
cleavage planes in feldspar adjacent to metamict britholite.
These are X-ray maps of the elements indicated. Some trace elements have
migrated along the structural discontinuities in the feldspar
References:
Halden, N.M., Campbell, J.L., and Teesdale, W.J. (1995) PIXE microanalysis in mineralogy
and petrology.Canadian Mineralogist. 33,
293-302.
Campbell, J.L., Teesdale, W.J. and Halden, N.M.
(1995) Theory, practice and application of PIXE microanalysis and SPM element
mapping. Canadian Mineralogist. 33, 279-292.
Halden, N.M.,
Campbell, J.L., and Teesdale, W.J.
(1995) Scanning proton microprobe mapping of rare elements in mineral
cleavages, fractures and grain boundaries: evidence for rare element mobility.
Canadian Mineralogist 33, 961-971.
Halden, N.M. (1993) High-energy Proton Beam Analysis of Geological Materials.
Nuclear Instruments and Methods in Physics Research, B77, 399 - 404.
Halden, N.M., Hawthorne, F.C. Campbell, J.L., Teesdale, W.J. and Maxwell, J.A. (1993)
Chemical characterization of oscillatory zoning in zircon using 2 - 3 MeV µ-PIXE. Canadian Mineralogist.
31, 637 - 648.
Halden, N.M., Hawthorne, F.C., Durocher, J.J.G., and McKee, J.S.C.
(1990) High-Energy K-line PIXE spectra of Au-bearing minerals. American
Mineralogist 75, 956-962.
Durocher, J.J.G., Halden, N.M., Hawthorne, F.C., and McKee, J.S.C. (1988). PIXE and micropixe analysis of minerals at Ep=40
MeV. Nuclear Instruments and Methods
(B30) 470-73.
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